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"Quantitative Methods for Validating Safety Integrity Levels (SIL) of Safety Instrumented Function (SIF)" - Robert A. Adamski, PCS Premier Consulting Services / Invensys USA
03 May 2006 - 03 May 2006
Location: PCS Premier Consulting Services / Invensys USA
Who should attend:
Programmable Electronic Systems Related Applications (7th Annual International Symposium)
03 May 2006 - 04 May 2006
Location: Cologne, Germany
Who should attend:
"Partial Stroke Testing - The Good, the Bad and the Ugly" - Robin McCrea-Steele, PCS
03 May 2006 - 03 May 2006
Location: PCS Premier Consulting Services / Invensys USA
Who should attend:
2006 Invensys Process Systems EMEA Customer Conference
29 May 2006 - 01 June 2006
Location: Baveno (on Lago Maggiore), Italy
Who should attend: Customers & Visitors Alike!
2006 Invensys Process Systems North America Customer Conference
04 December 2006 - 07 December 2006
Location: Dallas, Texas
Who should attend: Invensys Process Systems Customers